Dr. Rachid Amrani | Physics | Best Researcher Award
Dr. Rachid Amrani, University of Algiers, Algeria
Dr. Rachid Amrani is a faculty member at the University of Algiers, Algeria. He currently holds the position of Lecturer B, a role he has occupied since July 2023, after serving as Lecturer A from February 2018. Before that, he was an Assistant Professor at the University of Algiers from February 2017 to February 2018. Dr. Amrani has a strong research background, having worked as a Research Scientist at the Center of Development of Advanced Technologies (CDTA) in Algiers from March 2016 to January 2017. Earlier in his career, from 2011 to 2013, he served as a Research Assistant to Dr. Yvan Cuminal at the Institut D’électronique Du Sud (IES), CNRS, University of Montpellier, France. His academic and research experience spans various institutions, focusing on advanced technologies and electronics.
Educational Details
Dr. Rachid Amrani earned his Ph.D. from the University of Montpellier, France, in December 2013, with a thesis focused on the “Growth and Properties of Hydrogenated Silicon Thin Films Deposited Near the Nanocrystalline Amorphous Transition Region from Argon Diluted Silane Plasma.” This work reflects his deep expertise in the field of material sciences, particularly in the study of thin films. Prior to his doctoral studies, Dr. Amrani completed a Magister degree in Physics with a specialization in material sciences at Université d’Oran Es-Senia, Algeria, from 2001 to 2006. His Magister thesis explored the “Optical Properties of Nanocrystalline Silicon Films Prepared by RF Magnetron Sputtering.” His academic journey began at Université d’Oran Es-Senia, where he earned his undergraduate degree in Physics with a focus on Theoretical Physics between 1992 and 1997. Throughout his career, Dr. Amrani has demonstrated a strong foundation in both theoretical and applied physics, particularly in the study of nanomaterials and thin film technologies.
Dr. Rachid Amrani’s research interests lie at the intersection of material sciences and nanotechnology, with a particular focus on the growth, deposition, and characterization of thin films. His expertise encompasses a range of advanced techniques, including Plasma Enhanced Chemical Vapor Deposition (PECVD), RF magnetron sputtering, and thermal evaporation. Dr. Amrani has extensive experience in cleanroom processes, such as UV lithography, chemical etching, and reactive ion etching, which are essential for fabricating precise nanostructures. His work in characterizing thin films involves sophisticated methods like ellipsometry, Raman scattering spectroscopy, and Atomic Force Microscopy (AFM), aiming to understand the optical and structural properties of nanocrystalline silicon films and other functional materials. Dr. Amrani’s contributions to the field are reflected in his numerous publications and presentations at international conferences, where he has shared his findings on nanomaterials for energy conversion, storage, and other cutting-edge applications in electronics and photonics.
Honours and Awards
The Journal of Non-Crystalline Solids (Elsevier) and the Journal of Nanotechnology (IOPscience) are both prestigious publications in their respective fields. The Journal of Non-Crystalline Solids focuses on the latest research in amorphous materials, including glasses, polymers, and composites, and is known for publishing cutting-edge studies that advance the understanding of non-crystalline structures. Meanwhile, the Journal of Nanotechnology provides a platform for the dissemination of research on nanoscience and nanotechnology, covering topics ranging from the synthesis and characterization of nanomaterials to their applications in various industries. These journals are widely recognized for their rigorous peer-review process and their role in promoting scientific advancements.
Investigation of Structural Heterogeneities in Hydrogenated Nanocrystalline Silicon Thin Films from Argon-Diluted Silane Dusty Plasma PECVD
Authors: R. Amrani, F. Lekoui, F. Pichot, S. Oussalah, Y. Cuminal
Year: 2024
Journal: Vacuum
Volume: 229
Article ID: 113568
Citations: 0
Machine Learning-Based Method for Predicting C–V-T Characteristics and Electrical Parameters of GaAs/AlGaAs Multi-Quantum Wells Schottky Diodes
Authors: E. Garoudja, A. Baouta, A. Derbal, N. Sengouga, M. Henini
Year: 2024
Journal: Physica B: Condensed Matter
Volume: 685
Article ID: 415998
Citations: 0
Structural and Optical Properties of Highly Ag-Doped TiO2 Thin Films Prepared by Flash Thermal Evaporation
Authors: R. Amrani, F. Lekoui, E. Garoudja, S. Oussalah, S. Hassani
Year: 2024
Journal: Physica Scripta
Volume: 99(6)
Article ID: 065914
Citations: 0
Optical Parameters Extraction of Zinc Oxide Thin Films Doped with Manganese Using an Innovative Technique Based on the Dragonfly Algorithm and Their Correlation to the Structural Properties
Authors: K. Settara, F. Lekoui, H. Akkari, S. Oussalah, S. Hassani
Year: 2024
Journal: Journal of Ovonic Research
Volume: 20(3)
Pages: 365–380
Citations: 0
On the Substrate Heating Effects on Structural, Mechanical, and Linear/Non-Linear Optical Properties of Ag–Mn Co-Doped ZnO Thin Films
Authors: F. Lekoui, R. Amrani, S. Hassani, N. Hendaoui, S. Oussalah
Year: 2024
Journal: Optical Materials
Volume: 150
Article ID: 115151
Citations: 4
A B3LYP-D3 Computational Study of Electronic, Structural, and Torsional Dynamic Properties of Mono-Substituted Naphthalenes: The Effect of the Nature and Position of Substituent
Authors: A. Benalia, A. Boukaoud, R. Amrani, A. Krid
Year: 2024
Journal: Journal of Molecular Modeling
Volume: 30(3)
Article ID: 88
Citations: 2
Electrical Parameters Extraction of Diode Using Whale Optimization Algorithm
Authors: E. Garoudja, W. Filali, S. Oussalah, F. Lekoui, R. Amrani
Year: 2024
Conference: 2nd International Conference on Electrical Engineering and Automatic Control (ICEEAC 2024)
Citations: 0
Effect of Ti/TiN Thin Film Geometrical Design on the Response of RTDs
Authors: W. Filali, E. Garoudja, F. Lekoui, S. Oussalah, R. Amrani
Year: 2024
Conference: 2nd International Conference on Electrical Engineering and Automatic Control (ICEEAC 2024)
Citations: 0
Artificial Intelligence Approach to Analyze SIMS Profiles of 11B, 31P, and 75As in n- and p-type Silicon Substrates: Experimental Investigation
Authors: W. Filali, M. Boubaaya, E. Garoudja, S. Oussalah, N. Sengouga
Year: 2023
Journal: Zeitschrift für Naturforschung – Section A Journal of Physical Sciences
Volume: 78(12)
Pages: 1143–1151
Citations: 0
Elaboration and Characterization of Pure ZnO, Ag, and Ag-Fe
Thin Films: Effect of Ag and Ag-Fe Doping on ZnO Physical Properties
Authors: F. Lekoui, S. Hassani, E. Garoudja, O. Sifi, S. Oussalah
Year: 2023
Journal: Revista Mexicana de Fisica
Volume: 69(5)
Article ID: 051005
Citations: 3